Title :
A high gain, wide bandwidth isolated amplifier for using in fracture process transient analysis
Author :
Perez, M.A. ; Romero, V. ; Anton, Juan C. ; Campo, J.C.
Author_Institution :
Area de Tecnologia Electron., Oviedo Univ., Spain
Abstract :
In this paper an instrumentation system for measuring the fracture mechanism in impact test of materials is presented. This kind of system could extend the applicability of impact tester to obtain additional information about the transient process that take place during the short rime of the fracture evolution
Keywords :
automatic test equipment; fracture mechanics; impact testing; operational amplifiers; signal processing equipment; strain gauges; transient analysers; fracture process analysis; impact tester; strain sensor; transient analysis; wide bandwidth isolated amplifier; Bandwidth; Bridge circuits; Capacitive sensors; Instruments; Materials testing; Strain measurement; Stress; System testing; Transient analysis; Voltage;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.846901
