The Study of VCO Automatic Test System Base on GPIB Bus

Author

Fu, Li ; Fu, Hua ; Jun-Song, Li ; Xian-Wu, Zhang

Author_Institution

Inst. of Inf. Sci. & Eng., Hebei Univ. of Sci. & Technol., Shijiazhuang, China

Volume

4

fYear

2010

fDate

14-15 Aug. 2010

Firstpage

57

Lastpage

59

Abstract

With the rapid development of 3G communications, RF circuits are becoming more widespread, so the electronic components VCO´s applications grows ever wider, because it is the core module in the oscillator circuit. A voltage-controlled oscillator automatic test system based on GPIB bus is introduced. This system and computer combination has changed the traditional manual operation, VCO production efficiency has been greatly improved; many parameters can be measured easily, the testing accuracy and reliability are all high, the investment is lower and intelligent function is stronger.

Keywords

automatic testing; integrated circuit reliability; integrated circuit testing; radiofrequency integrated circuits; voltage-controlled oscillators; 3G communications; GPIB bus; RF circuits; VCO automatic test system; VCO production efficiency; core module; oscillator circuit; reliability; testing accuracy; voltage-controlled oscillator automatic test system; Computers; Instruments; Power measurement; Testing; Voltage measurement; Voltage-controlled oscillators; Automatic Test; GPIB (general-purpose interface bus); VCO (voltage-controlled oscillator); testing box;

fLanguage

English

Publisher

ieee

Conference_Titel

Information Engineering (ICIE), 2010 WASE International Conference on

Conference_Location

Beidaihe, Hebei

Print_ISBN

978-1-4244-7506-3

Electronic_ISBN

978-1-4244-7507-0

Type

conf

DOI

10.1109/ICIE.2010.303

Filename

5571681