DocumentCode :
2065798
Title :
The Study of VCO Automatic Test System Base on GPIB Bus
Author :
Fu, Li ; Fu, Hua ; Jun-Song, Li ; Xian-Wu, Zhang
Author_Institution :
Inst. of Inf. Sci. & Eng., Hebei Univ. of Sci. & Technol., Shijiazhuang, China
Volume :
4
fYear :
2010
fDate :
14-15 Aug. 2010
Firstpage :
57
Lastpage :
59
Abstract :
With the rapid development of 3G communications, RF circuits are becoming more widespread, so the electronic components VCO´s applications grows ever wider, because it is the core module in the oscillator circuit. A voltage-controlled oscillator automatic test system based on GPIB bus is introduced. This system and computer combination has changed the traditional manual operation, VCO production efficiency has been greatly improved; many parameters can be measured easily, the testing accuracy and reliability are all high, the investment is lower and intelligent function is stronger.
Keywords :
automatic testing; integrated circuit reliability; integrated circuit testing; radiofrequency integrated circuits; voltage-controlled oscillators; 3G communications; GPIB bus; RF circuits; VCO automatic test system; VCO production efficiency; core module; oscillator circuit; reliability; testing accuracy; voltage-controlled oscillator automatic test system; Computers; Instruments; Power measurement; Testing; Voltage measurement; Voltage-controlled oscillators; Automatic Test; GPIB (general-purpose interface bus); VCO (voltage-controlled oscillator); testing box;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Engineering (ICIE), 2010 WASE International Conference on
Conference_Location :
Beidaihe, Hebei
Print_ISBN :
978-1-4244-7506-3
Electronic_ISBN :
978-1-4244-7507-0
Type :
conf
DOI :
10.1109/ICIE.2010.303
Filename :
5571681
Link To Document :
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