• DocumentCode
    2065942
  • Title

    Macro-I: a gateway to instrumentation education

  • Author

    Schmalzel, J.L. ; Dyer, S.A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Rowan Univ., Glassboro, NJ, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    467
  • Abstract
    Teaching instrumentation is challenging due to the wide range of topics that can-and should-be considered. This paper summarizes an approach to instrumentation education that attempts to remain focused on a systems-level view. The objective of the course focuses on giving students the tools they need to understand and use instruments and to impart enough information to allow students to create useful electronic instruments comprising functional subsystems. A design project is given at the beginning of the course to achieve this goal. Design projects are chosen to provide motivation and affirmation of course content. For example, recent instrument-design projects included an eddy-current device, an environmental station, a particle levitator, a semiconductor-noise-measurement system, and a PDA-based protocol analyzer. The experience has been positive as measured by student responses and their ability to complete useful instruments
  • Keywords
    educational courses; electronic engineering education; instrumentation; Macro-Instrumentation; PDA-based protocol analyzer; course content affirmation; design project; eddy-current device; electronic instruments; environmental station; functional subsystems; instrumentation education; motivation; particle levitator; project-based learning; semiconductor-noise-measurement system; student responses; systems-level view; Application software; Computer science education; Electrical engineering computing; Engineering education; Instruments; Laboratories; Mathematics; Problem-solving; Signal processing; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-5890-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2000.846908
  • Filename
    846908