Title :
Challenge of the 90´s: testing CoreWare(TM) based ASICs
Author :
Rajsuman, Rochit
Author_Institution :
LSI Logic Corp., Milpitas, CA, USA
Abstract :
Testing of CoreWare based ASICs is emerging as the most challenging problem of the 1990s. The testing challenge is two fold: first, how to test the embedded cores; and second, how to integrate the test-set of a core with other blocks into ASIC level test-set. Each of these problems is further compounded by the Intellectual Property (IP) protection issue
Keywords :
application specific integrated circuits; boundary scan testing; built-in self test; fault diagnosis; industrial property; integrated circuit testing; network routing; ASIC level test-set; ASICs; CoreWare; embedded cores; intellectual property protection; test-set integration; Application specific integrated circuits; Automatic testing; Built-in self-test; Cryptography; Delay; Intellectual property; Large scale integration; Logic testing; Pins; Protection;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.557169
