DocumentCode :
2066138
Title :
The electrolytic capacitive displacement transducer for nano-technologies
Author :
Castelli, F.
Author_Institution :
Dipt. di Elettrotecnica, Politecnico di Milano, Italy
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
501
Abstract :
The paper deals with the basic principle of a new capacitive displacement transducer, the “electrolytic capacitive transducer” (ECT), for small displacements (from a few micrometers to a few millimeters with nanometer resolution). The principle of the ECT is based on the use of both a very thin dielectric film between the faced electrodes and the enlargement of the effective equivalent faced electrodes surface by etching the dielectric film both obtained by the electrolytic capacitor construction technique. The transducer is designed in a differential form. Its electrodes are constructed by photochemical-etching. A first implementation prototype, a linear displacement form transducer, has been designed and constructed using a dielectric etched film of alumina, 0.35 μm thick. The test results obtained on this prototype are critically analyzed. Its sensitivity and resolution are respectively 0.5 μF/mm or 0.5 nF/μm and, by a 61/2 digit DMM, 2 nm nearly in absence of nonlinearities. On the basis of the present test results, a proposal for a variable absolute scale of capacitance and capacitive voltage divider is illustrated
Keywords :
capacitive sensors; displacement measurement; electrolytic capacitors; etching; nanotechnology; alumina film; capacitive displacement transducer; capacitive voltage divider; differential form transducer; electrode surface enlargement; electrolytic capacitive transducer; faced electrodes; implementation prototype; linear displacement form transducer; nanometer resolution; nanotechnology; photochemical-etching; resolution; sensitivity; small displacements; variable absolute capacitance scale; very thin dielectric film; Capacitors; Dielectric films; Electrical capacitance tomography; Electrodes; Etching; Photochemistry; Proposals; Prototypes; Testing; Transducers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
ISSN :
1091-5281
Print_ISBN :
0-7803-5890-2
Type :
conf
DOI :
10.1109/IMTC.2000.846916
Filename :
846916
Link To Document :
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