Title :
Design Techniques to Improve Blocker Tolerance of Continuous-Time
ADCs
Author :
Geddada, Hemasundar Mohan ; Chang-Joon Park ; Hyung-Joon Jeon ; Silva-Martinez, Jose ; Karsilayan, Aydin Ilker ; Garrity, Douglas
Author_Institution :
Texas A&M Univ., College Station, TX, USA
Abstract :
Design techniques to provide robustness against loop saturation due to blockers in ΣA modulators are presented. Loop overload detection and correction are employed to improve the analog-to-digital converters (ADCs) tolerance to strong blockers; a fast overload detector activates the input attenuator, maintaining the ADC in linear operation. To further improve ADCs blocker tolerance, a minimally invasive integrated low-pass filter that reduces the most critical adjacent/alternate channel blockers is implemented. Measurement results show that the proposed ADC implemented in a 90nm CMOS process achieves 69dB dynamic range over a 20MHz bandwidth with a sampling frequency of 500 MHz and 17.1 mW of power consumption. The alternate channel blocker tolerance at the most critical frequency is as high as -5.5 dBFS while the conventional feedforward modulator becomes unstable at -23.5 dBFS of blocker power. The proposed blocker rejection techniques are minimally invasive and take less than 0.3 μs to settle after a strong agile blocker appears.
Keywords :
CMOS integrated circuits; analogue-digital conversion; delta-sigma modulation; low-pass filters; CMOS process; analog-to-digital converters; blocker rejection techniques; blocker tolerance improvement; continuous-time ΔΣ ADC; design techniques; frequency 500 MHz; linear operation; loop correction; loop overload detection; loop saturation; minimally invasive integrated low-pass filter; power 17.1 mW; size 90 nm; Clocks; Feedforward neural networks; Gain; Jitter; Modulation; Noise; Transfer functions; Analog-to-digital converter (ADC); blockers; broadband radio receivers; continuous-time sigma-delta modulation; digital calibration; digital-to-analog converter (DAC); jitter; low power; low power.;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2014.2303815