DocumentCode :
2066380
Title :
Dynamic phase measurement by clustering method
Author :
Huang, Y.H. ; Hung, S.Y. ; Chen, Y.S. ; Liu, L. ; Ng, S.P.
Author_Institution :
Dept. of Mech. & Ind. Eng., Ryerson Univ., Toronto, ON, Canada
fYear :
2010
fDate :
25-27 Oct. 2010
Firstpage :
1
Lastpage :
4
Abstract :
Phase measurement is a key step in quantitative optical metrology. While phase shifting technique is widely applied for accurate and reliable static or semi-static phase measurement, Fourier and wavelet transforms are often employed for high speed dynamic phase measurement. In our previous papers, the authors had proposed an alternative clustering method for dynamic phase measurement. The proposed method utilizes the phase clustering effect and the prior knowledge of the speckle field to extract the deformed phase map from one single deformed speckle pattern. The clustering method, however, may fail at area with abundant noise and large phase gradient. In this paper, we improve the clustering method by incorporating an advanced phase filtering methods for wrapped phase filtering. The reconstructed wrapped phase map is with very good quality and ready for phase unwrapping with any simple unwrapping algorithms. The basic ideas and the implementation approach will be described in details. Several examples based on shearography and holographic interferometry will be presented. Comparisons between the proposed method and phase shifting method will be made. The results demonstrate the accuracy and robustness of the integrated dynamic phase extraction method. The integrated phase retrieval method proposed here has great potential to simplify optical setup for dynamic phase measurement.
Keywords :
Fourier transform optics; holographic interferometry; image reconstruction; optical variables measurement; pattern clustering; shearography; speckle; Fourier transforms; dynamic phase measurement; holographic interferometry; integrated dynamic phase extraction; integrated phase retrieval; phase clustering effect; phase shifting; phase unwrapping; reconstructed wrapped phase map; shearography; simple unwrapping algorithms; single deformed speckle pattern; wavelet transforms; Clustering methods; Filtering; Noise; Optical filters; Optical interferometry; Phase measurement; Speckle; Dynamic phase extraction; Fourier transform; clustering; shearography; wrapped phase filtering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optomechatronic Technologies (ISOT), 2010 International Symposium on
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4244-7684-8
Type :
conf
DOI :
10.1109/ISOT.2010.5687314
Filename :
5687314
Link To Document :
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