• DocumentCode
    2066472
  • Title

    Network functions for characterization of elementary semiconductor nanostructures

  • Author

    Wong, Ted ; Tao Shen

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • fYear
    2013
  • fDate
    28-31 Oct. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    As the frequency of operation of integrated circuits approaches the terahertz range, plasmonic interactions of charge carriers in the devices will have influence on their performance or become the enabling mechanism for new functional circuits. Space-charge dynamics in elementary semiconductor nanostructors can be characterized by their response to electric field excitation as conveyed by the corresponding network functions. These network functions provide insight to the nature of field-charge interactions and offer a framework for the modeling of complex structures with the aid of network theory. Network functions for a semiconductor nanoplate and a spherical nanoparticle are synthesized from charge-transport consideration for efficient characterization of the polarizability of these two elementary structures. Frequency response of the polarization given by the network functions are compared to that obtained by field analysis and simulation.
  • Keywords
    charge exchange; nanoparticles; plasmonics; space charge; submillimetre wave integrated circuits; charge carriers; charge-transport consideration; electric field excitation; elementary semiconductor nanostructures; field-charge interactions; frequency response; integrated circuits; network functions; network theory; operation frequency; plasmonic interactions; polarizability; semiconductor nanoplate; space-charge dynamics; spherical nanoparticle; terahertz range; Admittance; Charge carriers; Electric fields; Equivalent circuits; Impedance; Nanostructures; Plasmons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC (ASICON), 2013 IEEE 10th International Conference on
  • Conference_Location
    Shenzhen
  • ISSN
    2162-7541
  • Print_ISBN
    978-1-4673-6415-7
  • Type

    conf

  • DOI
    10.1109/ASICON.2013.6811941
  • Filename
    6811941