Title :
Comparison of component and system level thermal performance for various thermally enhanced packages and PCB layouts
Author :
Berg, Mark J. ; Dakuginow, Sambu ; Apides, Roland ; Lacap, Efren
Author_Institution :
Seagate Technol., Bloomington, MN, USA
Abstract :
In high performance disc drive applications, high data rate channel chips packaged in standard QFPs can exceed design rules for maximum junction temperature. To meet these design rules and to add a margin for increased reliability, various thermally enhanced packages were characterized at component and system level, with a goal of cost/power optimization, while meeting package reliability requirements. The thermal environment (heat from neighbor chips on PCB, etc.) was held constant while trying different packages and PCB layouts. At system level, case temperature measurements were made in still air and moving air, using an IR thermography camera. In addition, two alternative thermal pad PCB layouts were evaluated at system level. Trade-offs in reliability and thermal performance for different material sets were then analyzed for present and future applications in terms of overall performance, manufacturability (at IC manufacturer and user), and cost. The resulting matrix of options facilitates decision making
Keywords :
circuit optimisation; circuit reliability; cooling; hard discs; infrared imaging; integrated circuit packaging; printed circuit layout; thermal analysis; IR thermography camera; PCB layouts; QFPs; case temperature measurements; channel chips; component level thermal performance; cost/power optimization; data rate; decision making; design rules; disc drive applications; manufacturability; maximum junction temperature; moving air measurements; package reliability; reliability; still air measurements; system level thermal performance; thermal environment; thermal pad PCB layouts; thermal performance; thermally enhanced packages; Cameras; Cost function; Design optimization; Drives; Electronics packaging; Manufacturing; Materials reliability; Performance analysis; Power system reliability; Temperature measurement;
Conference_Titel :
Electronic Packaging Technology Conference, 1997. Proceedings of the 1997 1st
Print_ISBN :
0-7803-4157-0
DOI :
10.1109/EPTC.1997.723888