• DocumentCode
    2066679
  • Title

    Material characterization of corner and edgebond epoxy adhesives for the improvement of board-level solder joint reliability

  • Author

    Wu, H. L Henry ; Song, Fubin ; Lo, Jeffery C C ; Jiang, Tong ; Newman, Keith ; Lee, S. W Ricky

  • Author_Institution
    EPACK Lab., Hong Kong Univ. of Sci. & Technol., Hong Kong
  • fYear
    2009
  • fDate
    26-29 May 2009
  • Firstpage
    125
  • Lastpage
    133
  • Abstract
    In this paper, the material characteristics of six epoxies used for corner/edge-bonding are analyzed and compared to board-level mechanical reliability test. An innovative material characterization approach, button shear testing, provided an expedient method of determining adhesive strength between the epoxies and each relevant surface material. The board-level test included mechanical shock test. A number of SMT test devices are evaluated, including 1849 CBGA packages, and 190 ball count mezzanine connectors. The failure modes and fracture strengths of the material characterization tests and board-level tests are cross-referenced for comparison, and assessed for correlation. The results from the present study not only contribute to the characterization and selection methods of corner/edge-bonding epoxies, but also improve understanding of the corresponding relationship between material characterization testing and the more complex and costly board-level reliability tests.
  • Keywords
    adhesives; ball grid arrays; failure analysis; fracture toughness; reliability; soldering; solders; surface mount technology; 1849 CBGA packages; 190 ball count mezzanine connectors; SMT test devices; board-level solder joint; edgebond epoxy adhesives; failure modes; fracture strengths; reliability; Adhesive strength; Connectors; Electric shock; Joining materials; Materials reliability; Materials testing; Packaging; Soldering; Surface cracks; Surface-mount technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-4475-5
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2009.5074006
  • Filename
    5074006