DocumentCode :
2066711
Title :
Integrated amorphous-Si TFT circuits for gate drivers on LCD panels
Author :
Nan-Xiong Huang ; Hsi Rong Han ; Wen Tui Liao ; Chih Hung Huang ; Wen Chun Wang ; Miin-Shyue Shiau ; Ching-Hwa Cheng ; Hong-Chong Wu ; Heng-Shou Hsu ; Liou, Juin J. ; Shry-Sann Liao ; Ruei-Cheng Sun ; Guang-Bao Lu ; Don-Gey Liu
Author_Institution :
Grad. Inst. of Electr. & Comm. Eng., Feng Chia Univ., Taichung, Taiwan
fYear :
2013
fDate :
28-31 Oct. 2013
Firstpage :
1
Lastpage :
4
Abstract :
In this study, the integrated circuit (IC) implemented by amorphous silicon (α-Si) thin-film transistors (TFTs) on the glass substrate was investigated. The target was aimed at the reliable design for the gate driver on the liquid crystal display (LCD) panels. In this design, the lifetime of TFT gate driver IC was tried to be improved. For practical considerations, single power supply voltage with single clocking scheme was specified in this TFT IC. In order to overcome the VTH shift of the vulnerable α-Si TFT, the dual pull-down structure was employed for critical parts. In this paper, both measurement and simulation results will be illustrated to demonstrate the performances of our circuits. With the obtained results, a system on a panel (SOP) is promising by α-Si TFT ICs.
Keywords :
amorphous semiconductors; driver circuits; elemental semiconductors; integrated circuit design; liquid crystal displays; silicon; thin film circuits; thin film transistors; LCD panels; Si; TFT; amorphous silicon; gate drivers; glass substrate; integrated circuit; liquid crystal display panels; power supply; system on a panel; thin-film transistors; Integrated circuits; Logic gates; Noise; Reliability; Thin film transistors; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC (ASICON), 2013 IEEE 10th International Conference on
Conference_Location :
Shenzhen
ISSN :
2162-7541
Print_ISBN :
978-1-4673-6415-7
Type :
conf
DOI :
10.1109/ASICON.2013.6811951
Filename :
6811951
Link To Document :
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