DocumentCode :
2066743
Title :
Interconnect Matching Design Rule Inferring and Optimization through Correlation Extraction
Author :
Kahng, Andrew B. ; Topaloglu, Rasit Onur
Author_Institution :
Univ. of California, San Diego
fYear :
2007
fDate :
1-4 Oct. 2007
Firstpage :
222
Lastpage :
229
Abstract :
New back-end design for manufacturability rules have brought guarantee rules for interconnect matching. These rules indicate a certain capacitance matching guarantee given spacing between interconnects and interconnect area. Yet, the number of these rules is so few that they are of limited value in circuit or interconnect optimization. A method to infer additional guarantees from the provided guarantees is necessary so that optimization can be optimal. In this paper, we target two problems. First, we present a methodology to infer additional matching guarantees through extracting correlation information from the given limited set of matching guarantees in the design manual. In order to achieve this, we propose a multi-function variant of multi-variate Newton-Raphson method to extract parameters of the proposed dimension-and distance-based process correlation model for interconnects. We propose to use the extracted correlation information to infer a continuum of matching rules through simulation with proposed modifications to the standard capacitance extraction procedure. Secondly, we show how to directly incorporate the inferred interconnect matching guarantees for accurate interconnect optimization in a flexible geometric programming construction. We show how much resource savings are possible through inferring of new matching rules. Applying the inferred mismatch guarantees allows a geometric programming-based H-tree optimization to reduce the clock tree resources 27% on average and up to 56%.
Keywords :
Newton-Raphson method; geometric programming; integrated circuit interconnections; integrated circuit layout; integrated circuit manufacture; trees (mathematics); H-tree optimization; capacitance matching; clock tree resources; correlation extraction; design for manufacturability; flexible geometric programming construction; interconnect matching design rule; multivariate Newton-Raphson method; process correlation model; Capacitance; Computer aided manufacturing; Computer science; Data mining; Delay; Design engineering; Design optimization; Foundries; Integrated circuit interconnections; Optimization methods; H-tree optimization; correlation extraction; design guarantee inferring; interconnect matching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design, 2006. ICCD 2006. International Conference on
Conference_Location :
San Jose, CA
ISSN :
1063-6404
Print_ISBN :
978-0-7803-9707-1
Electronic_ISBN :
1063-6404
Type :
conf
DOI :
10.1109/ICCD.2006.4380821
Filename :
4380821
Link To Document :
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