Title :
Surface analysis of outgassing contamination from edgebond epoxy adhesives on ImAg pads
Author :
Wu, H. L Henry ; Song, Fubin ; Newman, Keith ; Lee, S. W Ricky
Author_Institution :
Center for Adv. Microsyst. Packaging, Hong Kong Univ. of Sci. & Technol., Hong Kong
Abstract :
This paper details the outgassing process during epoxy degradation and evaluates the corresponding influence on adjacent PWB pads for immersion Ag (ImAg) plated circuit boards. Three commercial epoxy adhesives used for edge-bonding of surface-mount (SMT) components were investigated. Scanning electron microscope (SEM) analysis and electron dispersive spectroscopy (EDS) was carried out to investigate the surface of the contaminated ImAg pads. Chemical states of the elements transferred to the pads were analyzed by X-ray Photoelectron Spectroscopy (XPS). The results from the present study showed some ingredients in the adhesives may be thermo-oxidized to gaseous by-products in the presence of oxygen and migrate out from the epoxy body, contaminating the adjacent ImAg pads. Further research will be needed to verify whether these gaseous by-products also contaminate surrounding components, and result in corrosion-related reliability failures.
Keywords :
X-ray chemical analysis; X-ray photoelectron spectra; adhesive bonding; circuit reliability; printed circuits; scanning electron microscopy; silver; surface chemistry; Ag; SEM; X-ray photoelectron spectroscopy; XPS; chemical states; corrosion- related reliability; edge-bonding; edgebond epoxy adhesives; electron dispersive spectroscopy; outgassing contamination; outgassing process; plated circuit boards; scanning electron microscopy; surface analysis; surface-mount components; Chemical analysis; Chemical elements; Degradation; Dispersion; Image analysis; Printed circuits; Scanning electron microscopy; Spectroscopy; Surface contamination; Surface-mount technology;
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2009.5074009