• DocumentCode
    2066770
  • Title

    Power-Constrained SOC Test Schedules through Utilization of Functional Buses

  • Author

    Hussin, Fawnizu Azmadi ; Yoneda, Tomokazu ; Fujiwara, Hideo ; Orailoglu, Alex

  • Author_Institution
    Nara Inst. of Sci. & Technol., Nara
  • fYear
    2007
  • fDate
    1-4 Oct. 2007
  • Firstpage
    230
  • Lastpage
    236
  • Abstract
    In this paper, we are proposing a core-based test methodology that utilizes the functional bus for test stimuli and response transportation. An efficient algorithm for the generation of a complete test schedule that efficiently utilizes the functional bus under a power constraint is described. The test schedule is composed of a set of test vector delivery sequences in small chunks, denoted as packets. The utilization of small packet sizes optimizes the functional bus utilization. The experimental results show that the methodology is highly effective compared to previous approaches that do not use the functional bus. The strong results of the proposed approach are particularly highlighted when small bus widths are considered, an important consideration in current SOC designs where increasingly larger bus widths pose routing and reliability challenges.
  • Keywords
    circuit testing; network synthesis; system-on-chip; SOC designs; core-based test methodology; functional buses utilization; power-constrained SOC test schedules; test vector delivery sequences; Automatic testing; Built-in self-test; Circuit testing; Cities and towns; Communication networks; Computer science; Information science; Performance evaluation; Processor scheduling; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design, 2006. ICCD 2006. International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1063-6404
  • Print_ISBN
    978-0-7803-9707-1
  • Electronic_ISBN
    1063-6404
  • Type

    conf

  • DOI
    10.1109/ICCD.2006.4380822
  • Filename
    4380822