DocumentCode
2066867
Title
Temperature dependency of coefficient of hygroscopic swelling of molding compound
Author
Park, Seungbae ; Zhang, Haojun ; Zhang, Xin ; Lung Ng, Siu ; Chong Lee, Ho
Author_Institution
Dept. of Mech. Eng., Binghamton Univ., Binghamton, NY
fYear
2009
fDate
26-29 May 2009
Firstpage
172
Lastpage
179
Abstract
Many polymer based materials, such as molding compound and underfill, are commonly used in plastic encapsulated packages. In spite of many advantages, most of them, however, are hydrophilic and absorb moisture when exposed to a humid environment. Moisture absorption induces swelling and deformation in a package and leads to failure in some cases. For example, when polymer materials swell upon absorbing moisture, while the adjacent non-polymeric materials, such as lead frame and silicon chip, do not, this induces hygroscopic mismatch stresses in a package [1]. It has been reported that swelling induced stresses are comparable to thermally induced stresses [2]. In this study, a new faster and accurate CHS (coefficient of hygroscopic swelling) measurement method using DIC (Digital Image Correlation) was proposed to measure CHS of molding compound material at various temperatures (between 25degC to 180degC). With this measurement, temperature dependency of CHS was quantified and reported. In addition to DIC, the results were utilized by the combination of TGA (Thermal Gravitational Analysis)/TMA (Thermal Mechanical Analyzer) method and finite element analysis (FEA).
Keywords
deformation; failure analysis; finite element analysis; moisture measurement; moulding; sorption; swelling; thermal analysis; coefficient-of-hygroscopic swelling; deformation; digital image correlation; failure; finite element analysis; moisture absorption; molding compound; plastic encapsulated packages; swelling; temperature 25 degC to 100 degC; thermal gravitational analysis; thermal mechanical analyzer; Absorption; Digital images; Moisture; Plastic packaging; Polymers; Semiconductor device measurement; Silicon; Temperature dependence; Temperature measurement; Thermal stresses; coefficient of hygroscopic swell (CHS); digital imaging correlation (DIC); finite element analysis; hygroscopic swelling; molding compound;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
978-1-4244-4475-5
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2009.5074012
Filename
5074012
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