Title :
Thin glass based packaging technologies for optoelectronic modules
Author :
Brusberg, L. ; Schröder, H. ; Töpper, M. ; Arndt-Staufenbiel, N. ; Röder, J. ; Lutz, M. ; Reichl, H.
Author_Institution :
Fraunhofer IZM, Berlin
Abstract :
The novel packaging approach glassPack is introduced as System-in-Package (SiP) technology. Wiring length can be reduced and integration density can be increased by stacking different assembled substrate layers and interconnecting them with one another resulting in 3D-SiP. Glass is an excellent material because of matched coefficient of thermal expansion (CTE) to silicon, high thermal load, dielectricity and high optical transparency over a wide wavelength range. Commercially available thin glass foils can be used as substrate material for electronic and optoelectronic modules. The goal of our ongoing development is making glass based packaging competitive with polymer based (e.g. chip-in-polymer) or silicon based packaging (e.g. silicon-through-via, stacked dies by wire bonding). Our work is focused on conductor trace and through-via realization as well as optical lightwave circuits integration using glass as substrate material. For through-vias in glass, holes were drilled in glass wafers by different laser technologies or etched using photosensitive glass and evaluated. Conductor traces and through-via interconnects were deposited on glass. Also, optical waveguide and fluidic channel integration in glass substrates were investigated. This paper presents the first demonstrator of our glass based packaging technology targeting sensor applications. Two silicon dies, a laser diode, two photodiodes and a fluidic-optical chip were mounted on a glass substrate and interconnected by 3D electrical wiring.
Keywords :
etching; fluidic devices; glass; lead bonding; optical waveguides; photodiodes; polymers; semiconductor lasers; silicon; surface mount technology; system-in-package; 3D electrical wiring interconnection; SiO2; coefficient-of-thermal expansion; conductor trace; drilling; etching; fluidic channel integration; fluidic-optical chip; glass wafers; integration density; laser diode; laser technology; mounting; optical lightwave circuit integration; optical waveguide; optoelectronic modules; photodiodes; photosensitive glass; polymer; silicon dies; silicon-based packaging; silicon-through-via; stacked dies; system-in-package technology; targeting sensor applications; thin-glass-based packaging technology; through-via realization; wire bonding; Conducting materials; Dielectric substrates; Electronic packaging thermal management; Glass; Integrated circuit interconnections; Optical interconnections; Optical materials; Optical sensors; Silicon; Wiring;
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2009.5074018