DocumentCode :
2067062
Title :
The role of surface morphology on interfacial adhesion in IC packaging
Author :
Lee, Charles ; Rasiah, Ignatius ; Chai, T.C. ; Gopalakrishnan, R.
Author_Institution :
Siemens Components Pte Ltd, Singapore
fYear :
1997
fDate :
8-10 Oct 1997
Firstpage :
201
Lastpage :
207
Abstract :
The role of surface morphology on moulding compound/leadframe adhesion was investigated. The surface morphology of the leadframe was modified by wet chemical treatments and abrasive blasting. In this study, the electroless Cu treatment was found to be more effective in imparting micro-level roughening than abrasive blasting. The surface roughness was found to improve interfacial adhesion and the results suggested that micro-roughness was more beneficial, rather than macro-roughness, for adhesion enhancement. The inadequacy of using RMS and Ra methods to quantify roughness was discussed. The surface area, surface area difference and power spectral density functions are proposed for more reliable and consistent roughness quantification
Keywords :
abrasion; adhesion; electroless deposition; encapsulation; integrated circuit modelling; integrated circuit packaging; integrated circuit testing; interface roughness; moulding; rough surfaces; surface topography; surface treatment; Cu; IC packaging; RMS methods; abrasive blasting; adhesion enhancement; electroless Cu treatment; interfacial adhesion; leadframe surface morphology; macro-roughness; micro-level roughening; micro-roughness; moulding compound/leadframe adhesion; power spectral density function; roughness quantification; surface area difference function; surface area function; surface morphology; wet chemical treatments; Adhesives; Integrated circuit packaging; Microelectronics; Rough surfaces; Sandblasting; Surface morphology; Surface roughness; Surface topography; Surface treatment; Thermodynamics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology Conference, 1997. Proceedings of the 1997 1st
Print_ISBN :
0-7803-4157-0
Type :
conf
DOI :
10.1109/EPTC.1997.723910
Filename :
723910
Link To Document :
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