DocumentCode :
2067122
Title :
Arc lengthening between divergent runners: influence of arc current, geometry and materials of runners and walls
Author :
Gauster, E. ; Rieder, W.
Author_Institution :
Inst. of Switching Devices & High Voltage Technol., Tech. Univ. of Vienna, Austria
fYear :
1996
fDate :
16-20 Sept. 1996
Firstpage :
1
Lastpage :
10
Abstract :
Arc motion along arc runners enclosing different opening angles from 60/spl deg/ to 150/spl deg/, symmetrically arranged, was investigated in a model switch at currents from 1 kA to 5 kA. Wall distance, wall and runner material were varied. The measured criteria were the lengthening time and the frequency of back-strikes. Narrow slots between lateral insulating walls caused fast arc motion and lengthening at 1 kA arc currents independent of the wall material (gassing or not). Increasing slot width delayed the arc and favoured back-strikes. Immobile arc bands appeared frequently and depended on the runner material when the walls were completely removed. Increasing current from 1 kA to 3 kA decreased the lengthening time due to the increase of the magnetic self-blast field. Further increase of the current up to 5 kA did not further accelerate the arc. Back-strikes and immobile arc bands were favoured on iron runners (nickel plated or not). Variation of the opening angle did not yield any significant influence on the lengthening time under advantageous running conditions (narrow slot width copper runners). Unfavourable conditions (5 kA, 150/spl deg/) caused frequently immobile arc bands in the lengthening area even on copper runners.
Keywords :
arcs (electric); circuit-breaking arcs; 1 to 5 kA; Cu; Fe; arc lengthening; back-strike; divergent runner; lateral insulating wall; magnetic self-blast field; slot; switch; Acceleration; Copper; Delay; Frequency measurement; Gas insulation; Iron; Length measurement; Magnetic materials; Switches; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 1996. Proceedings of the Forty-Second IEEE Holm Conference on ??. Joint with the 18th International Conference on Electrical Contacts
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-3578-3
Type :
conf
DOI :
10.1109/HOLM.1996.557173
Filename :
557173
Link To Document :
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