DocumentCode :
2067140
Title :
High performance liquid epoxy encapsulant for advanced semiconductor package
Author :
Kanaji, K. ; Mizuike, K. ; Nishiguchi, T.
Author_Institution :
Nagase-CIBA Ltd., Hyogo, Japan
fYear :
1997
fDate :
8-10 Oct 1997
Firstpage :
215
Lastpage :
218
Abstract :
LEE (liquid epoxy encapsulant) has been used in the electronic assembly industry mainly for COB (chip on board) applications in the past which do not require high performance reliability. Nevertheless, new package development has brought CDBGAs (cavity down BGAs), for example, such as tape-BGAs, metal-BGAs, and plastic BGAs, as well as flip chip applications in the market where high performance encapsulants are needed. Due to the unique configurations and requirements of these new packages, potting and underfilling processes have replaced transfer molding as the encapsulation method and the conventional EMC (epoxy molding compound) has been used on substrates (mainly organic and some ceramic) instead of a metal leadframe, and therefore low warpage is required. In addition, the reliability requirements of temperature cycling, thermal shock and moisture resistance which applied to conventional IC packages are also applied to BGA and flip chip applications. An advanced epoxy encapsulant system for potting and underfilling applications was developed to meet the stringent requirements of new semiconductor packages with excellent performance
Keywords :
ball grid arrays; encapsulation; flip-chip devices; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; moisture; moulding; plastic packaging; polymer films; thermal shock; thermal stresses; BGA; COB; IC packages; cavity down BGAs; ceramic substrates; chip on board; electronic assembly; encapsulants; encapsulation method; epoxy encapsulant system; epoxy molding compound; flip chip; flip chip applications; liquid epoxy encapsulant; metal leadframe; metal-BGAs; moisture resistance; organic substrates; package potting; package underfilling; performance reliability; plastic BGAs; reliability; semiconductor package; tape-BGAs; temperature cycling; thermal shock; transfer molding; warpage; Assembly; Consumer electronics; Electronics industry; Electronics packaging; Flip chip; Industrial electronics; Plastic packaging; Semiconductor device packaging; Thermal resistance; Transfer molding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology Conference, 1997. Proceedings of the 1997 1st
Print_ISBN :
0-7803-4157-0
Type :
conf
DOI :
10.1109/EPTC.1997.723912
Filename :
723912
Link To Document :
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