DocumentCode :
2067179
Title :
Effects of interfacial residual stress on Tg of epoxy resin
Author :
Wang, Hongbing ; Siow, Kok Siong
Author_Institution :
Dept. of Chem., Nat. Univ. of Singapore, Singapore
fYear :
1997
fDate :
8-10 Oct 1997
Firstpage :
228
Lastpage :
232
Abstract :
Distinct differences in the glass transition temperatures (Tg ) of epoxy resins were observed when their samples were prepared in two different ways. In the first method (A) of preparation, the mixture of epoxy resin and curing agent was cured and cooled directly in an aluminum pan for DSC measurement. There were strong interfacial residual stresses in these samples. In the second method (B), epoxy resin was cured and cooled on a polytetrafluoroethylene (PTFE) plate, cut into small circular pieces and then placed in aluminum pans, and no interfacial residual stresses were found in these samples. The curing and cooling conditions for samples prepared by these two methods were otherwise exactly the same. The samples by method A with strong residual stresses showed lower Tg and broader transition ranges (δT) than those by method B. With an increase in the rate of cooling for epoxy resin, the Tg for samples by method A decreased more than that for samples by method B. The transition range for A samples also increased more than that for B samples. The effects of residual stress on Tg are substantiated by experimental results of the relaxation of interfacial residual stress or the incorporation of freezing stress
Keywords :
differential scanning calorimetry; encapsulation; freezing; glass transition; heat treatment; integrated circuit packaging; internal stresses; materials testing; moulding; plastic packaging; polymers; thermal stresses; Al; DSC measurement; PTFE plate; aluminum pan cooling; cooling; cooling conditions; cooling rate; curing; curing conditions; encapsulation; epoxy resin; epoxy resin/curing agent mixture; freezing stress; glass transition temperatures; interfacial residual stress effects; interfacial residual stress relaxation; interfacial residual stresses; moulding compounds; plastic IC packaging; polytetrafluoroethylene plate; residual stresses; transition ranges; Aluminum; Cooling; Curing; Epoxy resins; Glass; Internal stresses; Residual stresses; Temperature; Thermal expansion; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology Conference, 1997. Proceedings of the 1997 1st
Print_ISBN :
0-7803-4157-0
Type :
conf
DOI :
10.1109/EPTC.1997.723914
Filename :
723914
Link To Document :
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