DocumentCode :
2067249
Title :
Mechanical characterization of ultra-thin films by combining AFM nanoindentation tests and peridynamic simulations
Author :
Celik, Emrah ; Oterkus, Erkan ; Guven, Ibrahim ; Madenci, Erdogan
Author_Institution :
Aerosp. & Mech. Eng. Dept., Univ. of Arizona, Tucson, AZ
fYear :
2009
fDate :
26-29 May 2009
Firstpage :
262
Lastpage :
268
Abstract :
In this study, the loading-unloading data obtained from the nono-indentation tests in combination with the peridynamic simulations are used to determine the elastic modulus and yield stress of the material. A simple search algorithm minimizing the difference between the predicted force- indentation depth and experiments leads to the determination of the material properties. Nano-indentation experiments are performed on both a soft polymer (polymethyldisiloxane (PDMS)) representative of the bulk dimensions, and a hard thin-film polymer (polystyrene (PS)) deposited on the bulk PDMS. Both the simulation and experimental results are validated by comparison against those previously published in the literature.
Keywords :
atomic force microscopy; elastic moduli; nanoindentation; polymer films; yield stress; AFM nanoindentation test; PS thin film; bulk PDMS; elastic modulus; force-indentation depth; hard thin-film polymer; peridynamic simulations; polymethyldisiloxane; polystyrene; search algorithm; soft polymer; ultrathin films; yield stress; Aerospace materials; Aerospace simulation; Aerospace testing; Atomic force microscopy; Computational modeling; Materials testing; Nanostructured materials; Optical films; Performance evaluation; Polymers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2009.5074026
Filename :
5074026
Link To Document :
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