DocumentCode
2067384
Title
The U.S. Rosetta Project at its first science target: Asteroid (2867) Steins, 2008
Author
Alexander, C. ; Sweetnam, D. ; Gulkis, S. ; Weissman, P. ; Holmes, D. ; Parker, J. ; Burch, J. ; Goldstein, R. ; Mokashi, P. ; Fuselier, S. ; McFadden, L.
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fYear
2010
fDate
6-13 March 2010
Firstpage
1
Lastpage
14
Abstract
On September 5, 2008, the International Rosetta Mission encountered its first formal science target of the mission, asteroid (2867) Steins. We report preliminary results from the U.S. experiments. NASA´s contribution to the Rosetta mission consists of an ultraviolet (UV) spectrometer, a microwave spectrometer, a plasma instrument, and a portion of the electronics package for a mass spectrometer. The UV spectrometer (Alice) was used to obtain the first far-ultraviolet (FUV) spectrum of an asteroid. A ten-minute integration, surrounding the time of closest approach, averaging over a variety of geometries, showed very good signal from 850 A¿ to 2000 A¿ in the FUV. The microwave instrument (MIRO) obtained a high signal to noise measurement at both observing frequencies, enabling key thermal parameters to be derived. The plasma instrument (IES) obtained a brief measurement of the solar wind, and the Double Focusing Mass Spectrometer (DFMS) of the ROSINA instrument obtained a signal just at closest approach. Laboratory work with analogue materials was begun.
Keywords
aerospace instrumentation; asteroids; mass spectrometers; microwave spectrometers; space research; ultraviolet spectrometers; AD 2008 09 05; IES; International Rosetta Mission; MIRO; ROSINA instrument; US Rosetta Project; asteroid (2867)Steins; double focusing mass spectrometer; electronics package; first formal science target; microwave spectrometer; plasma instrument; solar wind; ultraviolet spectrometer; Design for manufacture; Electronics packaging; Frequency; Geometry; Instruments; Mass spectroscopy; Noise measurement; Plasma applications; Plasma materials processing; Plasma measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace Conference, 2010 IEEE
Conference_Location
Big Sky, MT
ISSN
1095-323X
Print_ISBN
978-1-4244-3887-7
Electronic_ISBN
1095-323X
Type
conf
DOI
10.1109/AERO.2010.5446988
Filename
5446988
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