DocumentCode :
2067495
Title :
Real-time textural defect detection based on label run length co-occurrence matrix
Author :
Mingde, Bi ; Zhigang, Sun ; Cao, Zou ; Yesong, Li
Author_Institution :
Dept. of Control Sci. & Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
fYear :
2011
fDate :
16-18 Dec. 2011
Firstpage :
271
Lastpage :
274
Abstract :
A new algorithm based on label run length co-occurrence matrix is proposed for real-time textural defect detection. Standing on the real-time constraint, 256 gray-levels are reduced to several tone labels so that the computational complexity of feature extraction is greatly reduced. Several features which emphasize continuous and directional property of the defect are extracted from the label run length co-occurrence matrix and used to characterize the presence of the defect. The extracted features of testing images are subjected to a Mahalanobis distance classifier, which is built with non-defective fabric images in the learning stage. The detection results of defects in both plain and twill textured fabrics are presented to validate the proposed algorithm.
Keywords :
computational complexity; fabrics; feature extraction; image classification; image texture; inspection; matrix algebra; production engineering computing; 256 gray-levels; Mahalanobis distance classifier; computational complexity; feature extraction; label run length cooccurrence matrix; nondefective fabric images; plain textured fabrics; real-time constraint; real-time textural defect detection; testing images; twill textured fabrics; Detection algorithms; Educational institutions; Fabrics; Feature extraction; Real time systems; Testing; Vectors; Mahalanobis distance; defect detection; fabric defect; label run co-occurrence matrix;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transportation, Mechanical, and Electrical Engineering (TMEE), 2011 International Conference on
Conference_Location :
Changchun
Print_ISBN :
978-1-4577-1700-0
Type :
conf
DOI :
10.1109/TMEE.2011.6199195
Filename :
6199195
Link To Document :
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