• DocumentCode
    2067618
  • Title

    Stochastic Dynamic Thermal Management: A Markovian Decision-based Approach

  • Author

    Jung, Hwisung ; Pedram, Massoud

  • Author_Institution
    Southern California Univ., Los Angeles
  • fYear
    2007
  • fDate
    1-4 Oct. 2007
  • Firstpage
    452
  • Lastpage
    457
  • Abstract
    This paper proposes a stochastic dynamic thermal management (DTM) technique in high-performance VLSI system with especial attention to the uncertainty in temperature observation. More specifically, we propose a stochastic thermal management framework to improve the accuracy of decision making in DTM, which performs dynamic voltage and frequency scaling to minimize total power dissipation and on-chip temperature. A key characteristic of the framework is that thermal states are controlled by stochastic processes, i.e., partially observable semi-Markov decision processes. Collaborative optimization is considered with mathematical programming formulations to reduce operating temperature by using multi-objective design optimization methods. Experimental results with 32-bit embedded RISC processor demonstrate the effectiveness of the technique and show that the proposed algorithm ensures thermal safety under performance constraints.
  • Keywords
    Markov processes; VLSI; decision making; mathematical programming; 32-bit embedded RISC processor; Markovian decision-based approach; collaborative optimization; decision making; dynamic voltage scaling; frequency scaling; high-performance VLSI system; mathematical programming; multi-objective design optimization methods; onchip temperature; stochastic dynamic thermal management; thermal safety; Decision making; Design optimization; Energy management; Power system management; Stochastic processes; Stochastic systems; Temperature; Thermal management; Uncertainty; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design, 2006. ICCD 2006. International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1063-6404
  • Print_ISBN
    978-0-7803-9707-1
  • Electronic_ISBN
    1063-6404
  • Type

    conf

  • DOI
    10.1109/ICCD.2006.4380855
  • Filename
    4380855