Title :
Research on the model of spectral BRDF for space target surface material
Author :
Sun, Chengming ; Yuan, Yan ; Zhang, Xiubao ; Wang, Qian ; Zhou, Zhiliang
Author_Institution :
Key Lab. of Precision Opto-Mechatron. Technol., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
Abstract :
In this paper, a five-parameter statistic model of spectral Bidirectional Reflectance Distribution Function (BRDF), which contains both of specular and diffuse reflection factors, is introduced for space target surface material. The optimal five parameters of the model at different wavelength are independently retrieved by using simulated annealing algorithm (SAA). An absolute measurement method of BRDF data is presented. A spectral radiation meter with 3nm resolution and a three-dimensional rotating system with 0.01° accuracy are utilized to establish the automatic measurement platform. The spectral BRDF data of typical space target sample (silver tinfoil) is measured in the range of 380-2500nm. The modeling results are coincided with the measured results, which verifies the validity of five-parameter statistic model.
Keywords :
light reflection; optical films; optical materials; optical rotation; optical variables measurement; reflectivity; silver; simulated annealing; 3D rotating system; Ag; absolute measurement method; diffuse reflection factors; five-parameter statistic model; simulated annealing algorithm; space target surface material; spectral BRDF; spectral bidirectional reflectance distribution function; specular reflection factors; wavelength 380 nm to 2500 nm; Extraterrestrial measurements; Materials; Optical surface waves; Reflection; Scattering; Surface roughness; Wavelength measurement; BRDF; absolute measurement; five-parameter model; sim ulated annealing; space target;
Conference_Titel :
Optomechatronic Technologies (ISOT), 2010 International Symposium on
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4244-7684-8
DOI :
10.1109/ISOT.2010.5687369