DocumentCode :
2068002
Title :
Development of Self-Calibration Techniques for On-Wafer and Fixtured Measurements: A Novel Approach
Author :
Pradell, L. ; Cáceres, M. ; Purroy, F.
Author_Institution :
Polithecnic University of Catalonia, ETSE Telecomunicació. Ap. 30002 - 08080 Barcelona - Spain
Volume :
2
fYear :
1992
fDate :
5-9 Sept. 1992
Firstpage :
919
Lastpage :
924
Abstract :
Network Analyzer self-calibration techniques - TRL, LMR, TAR- are developed, implemented and compared in several transmission media. A novel LMR (Line-Match-Reflect) technique based on known LINE and REFLECT Standards, is proposed and compared to conventional LMR (based on known LINE and MATCH Standards) and other techniques (TRL, TAR). They are applied to on-wafer S-parameter measurement as well as to coaxial, waveguide and microstrip media. Experimental results up to 40 GHz are presented.
Keywords :
Calibration; Coaxial components; Equations; Land mobile radio; Microstrip; Scattering parameters; Semiconductor device measurement; Transmission line matrix methods; Transmission line measurements; Transmission line theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1992. 22nd European
Conference_Location :
Helsinki, Finland
Type :
conf
DOI :
10.1109/EUMA.1992.335822
Filename :
4135567
Link To Document :
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