• DocumentCode
    2068257
  • Title

    Sinusoidal fringe-pattern projection for 3-D surface measurement with variable illuminance

  • Author

    Waddington, Christopher ; Kofman, Jonathan

  • Author_Institution
    Dept. of Syst. Design Eng., Univ. of Waterloo, Waterloo, ON, Canada
  • fYear
    2010
  • fDate
    25-27 Oct. 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper presents a method of projecting sinusoidal fringe patterns with modified maximum gray level to accommodate variable ambient illuminance that would otherwise cause intensity saturation and measurement error in phase-shifting surface-shape measurement. The maximum input gray level (MIGL) in the projected patterns can be reduced to an optimal trade-off point, below which the image intensity signal-to-noise ratio would diminish the advantage of further MIGL reduction. Measurement simulations using ten MIGLs (75 to 255) demonstrated reduction in RMS errors for ambient illuminance of 600, 700, 800 and 900 lx, from 0.31, 0.45, 0.75 and 1.21 mm, respectively, to 0.2 mm. The advantage of the approach was confirmed in real measurements of a flat plate and human mask.
  • Keywords
    measurement errors; optical images; optical projectors; shape measurement; 3D surface measurement; MIGL; RMS error; image intensity; intensity saturation; maximum input gray level; measurement error; phase-shifting surface-shape measurement; signal-to-noise ratio; sinusoidal fringe-pattern projection; variable ambient illuminance; Computational modeling; Measurement errors; Measurement uncertainty; Noise; Noise measurement; Optimized production technology; Phase measurement; fringe projection; gray level; illuminance; saturation; shape measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optomechatronic Technologies (ISOT), 2010 International Symposium on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4244-7684-8
  • Type

    conf

  • DOI
    10.1109/ISOT.2010.5687389
  • Filename
    5687389