Title :
Demonstration of high quality and low loss millimeter wave passives on embedded wafer level packaging platform (EMWLP)
Author :
Lim, Ying Ying ; Vempati, Srinivasa Rao ; Su, Nandar ; Xiao, Xianghua ; Zhou, Jinchang ; Kumar, Aditya ; Thaw, Phyo Phyo ; Sharma, Gaurav ; Lim, Teck Guan ; Liu, Shiguo ; Vaidyanathan, Kripesh ; Lau, John H.
Author_Institution :
Inst. of Microelectron., Agency for Sci., Technol. & Res., Singapore
Abstract :
With the increasing demand for system integration to cater for continuously increasing I/Os as well as higher operating frequencies, EMWLP is emerging as a promising technology for integration. This platform allows integrated passives to be designed in the redistribution layers using the mold compound as a substrate, which significantly improves the passives performance compared to those of on-chip. In this paper, we present the results of high quality passives on EMWLP platform that are benchmarked against high resistivity silicon (HiRSi). The passives were then demonstrated in two band pass filters targeted to operate in the IEEE 802.11a band, with electrical performances comparable to that of commercial IPDs. Using the same platform, the measured loss characteristics of transmission lines up to 110 GHz is reported. We also demonstrate for the first time a low loss narrowband 77-GHz band pass filter on EMWLP platform, with a good correlation obtained between simulation and measurement results.
Keywords :
band-pass filters; elemental semiconductors; millimetre wave devices; silicon; wafer level packaging; IEEE 802.11a band; band pass filters; embedded wafer level packaging platform; high quality millimeter wave passives; high resistivity silicon; integrated passives; low loss millimeter wave passives; redistribution layers; Band pass filters; Conductivity; Frequency; Loss measurement; Millimeter wave technology; Narrowband; Propagation losses; Silicon; Transmission line measurements; Wafer scale integration;
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2009.5074062