Title :
Electromagnetic compatibility modeling techniques: Past, present and future
Author :
Ruehli, Albert E. ; Miersch, Ekkehard
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY
Abstract :
We consider the evolution of EMC modeling techniques in this companion paper to the keynote address. The impact of work in the past is considered and an overview and summary of the relevant techniques used today is given. We also attempt to predict future trends based on observations on past and todaypsilas progress. Fortunately for the industry, EMC modeling has expanded considerably in the last few years due to its increasing importance. Today, the design of a high performance system without these modeling tools would not be possible. We will limit the presentation to the modeling area. Of course measurements also have an important role in the advances of the state of the art.
Keywords :
electromagnetic compatibility; EMC modeling; electromagnetic compatibility modeling techniques; Circuit theory; Electromagnetic compatibility; Electromagnetic measurements; Electromagnetic modeling; Electromagnetic scattering; Maxwell equations; Microprocessors; Packaging; Technological innovation; Transportation;
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
DOI :
10.1109/APEMC.2008.4559796