DocumentCode :
2068533
Title :
Piezoelectric force microscopy study of local bipolar diode current dependence of preferential domain orientation in BiFeO3 thin films with different thicknesses
Author :
Long He ; Zhihui Chen ; Anquan Jiang
Author_Institution :
Dept. of Microelectron., Fudan Univ., Shanghai, China
fYear :
2013
fDate :
28-31 Oct. 2013
Firstpage :
1
Lastpage :
4
Abstract :
Local hysteretic diode currents depending on domain orientations have been observed in epitaxial BiFeO3 thin films. The mechanism behind the bilateral and unilateral current hysteresis as well as retention of the nanodomains has been discussed in the films with different thicknesses. Piezoelectric force microscopy investigations reveal principle of resistive property is the switchable polarization control of hysteretic diode currents other than the creation and rupture of the conductive paths in other resistive random access memories mediated by mobile charged defects. With the investigation of different leakage current models, it has been found that the space-charge limited current (SCLC) dominates the conduction.
Keywords :
atomic force microscopy; hysteresis; leakage currents; piezoelectric thin films; random-access storage; semiconductor diodes; space charge; BiFeO3; SCLC; domain orientations; epitaxial thin films; leakage current models; local bipolar diode; local hysteretic diode currents; piezoelectric force microscopy; resistive random access memories; space charge limited current; switchable polarization control; unilateral current hysteresis; Current measurement; Electrodes; Films; Semiconductor diodes; Shape; Switches; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC (ASICON), 2013 IEEE 10th International Conference on
Conference_Location :
Shenzhen
ISSN :
2162-7541
Print_ISBN :
978-1-4673-6415-7
Type :
conf
DOI :
10.1109/ASICON.2013.6812022
Filename :
6812022
Link To Document :
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