• DocumentCode
    2068533
  • Title

    Piezoelectric force microscopy study of local bipolar diode current dependence of preferential domain orientation in BiFeO3 thin films with different thicknesses

  • Author

    Long He ; Zhihui Chen ; Anquan Jiang

  • Author_Institution
    Dept. of Microelectron., Fudan Univ., Shanghai, China
  • fYear
    2013
  • fDate
    28-31 Oct. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Local hysteretic diode currents depending on domain orientations have been observed in epitaxial BiFeO3 thin films. The mechanism behind the bilateral and unilateral current hysteresis as well as retention of the nanodomains has been discussed in the films with different thicknesses. Piezoelectric force microscopy investigations reveal principle of resistive property is the switchable polarization control of hysteretic diode currents other than the creation and rupture of the conductive paths in other resistive random access memories mediated by mobile charged defects. With the investigation of different leakage current models, it has been found that the space-charge limited current (SCLC) dominates the conduction.
  • Keywords
    atomic force microscopy; hysteresis; leakage currents; piezoelectric thin films; random-access storage; semiconductor diodes; space charge; BiFeO3; SCLC; domain orientations; epitaxial thin films; leakage current models; local bipolar diode; local hysteretic diode currents; piezoelectric force microscopy; resistive random access memories; space charge limited current; switchable polarization control; unilateral current hysteresis; Current measurement; Electrodes; Films; Semiconductor diodes; Shape; Switches; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC (ASICON), 2013 IEEE 10th International Conference on
  • Conference_Location
    Shenzhen
  • ISSN
    2162-7541
  • Print_ISBN
    978-1-4673-6415-7
  • Type

    conf

  • DOI
    10.1109/ASICON.2013.6812022
  • Filename
    6812022