Title :
Evaluation of power supply noise in CMOS and low noise logic cells
Author :
Zhou, Junfeng ; Dehaene, Wim
Author_Institution :
ESAT-MICAS, Katholieke Univ. Leuven, Heverlee
Abstract :
In digital designs, it becomes more and more important to reduce the supply current variations (di/dt noise) they induce in the supply lines. This is due to the fact that steep variations in supply current give rise to EM (Electro-Magnetic) radiation. In this paper, two new modified low-noise logic styles - Complementary-CBL (C-CBL) and Enhanced-CSL (E-CSL) are presented in which the di/dt noise due to the switching is reduced greatly with respect to standard CMOS (SCMOS) circuits. Furthermore, a comparison with existing alternative low noise techniques shows that, for the same supply voltage and the same power consumption, the Enhanced-CSL circuits have smaller area, higher noise margins and smaller propagation delay.
Keywords :
CMOS logic circuits; integrated circuit noise; CMOS circuits; digital designs; electro-magnetic radiation; enhanced current-steering logic circuits; low noise logic cells; noise margins; power supply noise; propagation delay; supply current variations; CMOS logic circuits; Circuit noise; Current supplies; Electromagnetic radiation; Energy consumption; Noise reduction; Power supplies; Propagation delay; Switching circuits; Voltage;
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
DOI :
10.1109/APEMC.2008.4559799