• DocumentCode
    2068649
  • Title

    Dynamic, nonlinear and passive immunity model of microcontroller for time domain simulation

  • Author

    Su, Tao ; Unger, Markus ; Steinecke, Thomas ; Weigel, Robert

  • Author_Institution
    Infineon Technol., Neubigerg
  • fYear
    2008
  • fDate
    19-23 May 2008
  • Firstpage
    28
  • Lastpage
    31
  • Abstract
    This paper presents an approach to simulate the immunity of the microcontroller based on dynamic, nonlinear and passive model. By introducing the dynamic elements, this modelling technique reflects both those dynamic and nonlinear behaviour of ports and cores of the microcontroller. It can simulate not only external interference from outside but also the internal interference of the microcontroller itself. The dynamic model is suitable for time domain simulation. It is capable of simulating both RF and pulse immunity of the microcontroller.
  • Keywords
    electromagnetic pulse; microcontrollers; dynamic nonlinear immunity model; internal interference; microcontroller model; nonlinear behaviour; passive immunity model; pulse immunity; time domain simulation; Circuit noise; Digital integrated circuits; Electric variables; Immunity testing; Integrated circuit modeling; Interference; Microcontrollers; Pins; Semiconductor device noise; Voltage; Dynamic; Immunity; Microcontroller; Modelling; Nonlinear; Passive;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-981-08-0629-3
  • Electronic_ISBN
    978-981-08-0629-3
  • Type

    conf

  • DOI
    10.1109/APEMC.2008.4559803
  • Filename
    4559803