Title :
Modelling of the susceptibility of 90 nm input output buffer
Author :
Boyer, A. ; Fer, M. ; Courau, L. ; Sicard, E. ; Dhia, S. Ben
Author_Institution :
INSA, Univ. of Toulouse, Toulouse
Abstract :
This paper deals with the modelling of the susceptibility to RF aggression of several input buffers structures implemented in a 90 nm test-chip. Measurement results, model construction and simulation flow are detailed.
Keywords :
buffer circuits; integrated circuits; radiofrequency interference; RF aggression; input output buffer; susceptibility; CMOS technology; Capacitors; Circuit simulation; Circuit testing; Electromagnetic compatibility; Electromagnetic measurements; Integrated circuit measurements; Integrated circuit modeling; Integrated circuit testing; Packaging; IC; Input-Output Buffer; susceptibility measurement and modeling;
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
DOI :
10.1109/APEMC.2008.4559804
