Title :
Evaluation environment of PCI peripherals power integrity and the improvement
Author :
Yuan, Shih-Yi ; Huang, Chun-Wei ; Liao, Shry-Sann
Author_Institution :
Commun. Eng., Feng Chia Univ., Taichung
Abstract :
Two measurement environments are put forth for PCI power integrity. These measurement environments are proposed to analyse the PCI power integrity under a HW/SW-codesign scenario BI coding. The experiment results show that, by applying the proposed environments to the same PCI target, cost is reduced while the measurement quality remains almost the same.
Keywords :
hardware-software codesign; peripheral interfaces; BI coding; HW-SW-co-design scenario; PCI peripherals power integrity; evaluation environment; measurement environments; Bismuth; Costs; Electromagnetic interference; Fluctuations; Hamming distance; Noise generators; Power generation; Power measurement; Rails; Stability;
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
DOI :
10.1109/APEMC.2008.4559806
