• DocumentCode
    2068800
  • Title

    SMAFTI package with planarized multilayer interconnects

  • Author

    Motohashi, N. ; Kurita, Y. ; Soejima, K. ; Tsuchiya, Y. ; Kawano, M.

  • Author_Institution
    NEC Electron. Corp., Sagamihara
  • fYear
    2009
  • fDate
    26-29 May 2009
  • Firstpage
    599
  • Lastpage
    606
  • Abstract
    A hybrid multilayer interconnect process and high-throughput die-to-wafer bonding technology were developed and introduced into the SMAFTI (SMArt chip connection with FeedThrough Interposer) package. The fine circuit layer FeedThrough Interposer (FTI) was fabricated between memory and logic dice and offers superior power/signal integrity, allowing over a thousand 3-D inter-chip connections through ultra-fine-pitch feedthrough vias. The unique fabrication processes of the multilayer FTI include a multilayer buildup process on a silicon wafer, filling in vias on the photosensitive polyimide layer, and planarization by chemical mechanical polishing (CMP), resulting in low production costs and an extremely flat surface that ensures void-free die bonding. A simultaneous metal/adhesive bonding process was also evaluated for high-throughput die-to-wafer bonding. Furthermore, the fine interconnect structure was verified to be fundamentally reliable.
  • Keywords
    adhesive bonding; chemical mechanical polishing; integrated circuit interconnections; integrated circuit packaging; microassembling; multilayers; polymer films; silicon; wafer bonding; 3D inter-chip connections; CMP; SMAFTI package; chemical mechanical polishing; fine circuit layer feedthrough interposer; high-throughput die-to-wafer bonding technology; hybrid multilayer interconnect process; metal-adhesive bonding; photosensitive polyimide layer; planarized multilayer interconnects; silicon wafer; ultra-fine-pitch feedthrough vias; void-free die bonding; Bonding; Fabrication; Filling; Integrated circuit interconnections; Logic circuits; Nonhomogeneous media; Packaging; Planarization; Polyimides; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-4475-5
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2009.5074074
  • Filename
    5074074