Title :
Bayesian spatial classifiers based on tree approximations to Markov random fields
Author :
Wu, Chi-hsin ; Doerschuk, Peter C.
Author_Institution :
Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
Describes a family of approximations, denoted “Bethe tree approximations”, for the computation of the marginal probability mass functions (pmfs) of a Markov random field (MRF). This is a key computation in spatial pattern classification when applied to the a posteriori MRF. The approximation modifies the graph on which the MRF is defined: the original lattice is modified into a tree. Then the marginal pmfs on the tree can be computed exactly by fast recursive algorithms. A key issue is how to terminate the tree at its leaves and 4 solutions are explored of which 3 result in the solution of nonlinear multivariable fixed-point equations for which some existence, uniqueness, and convergence-of-algorithm results can be proven. The algorithm has given excellent performance on a variety of segmentation problems (1994) and a 9-class agricultural remote-sensing example is described
Keywords :
Bayes methods; Markov processes; agriculture; approximation theory; geophysical signal processing; geophysical techniques; image classification; image segmentation; nonlinear equations; random processes; remote sensing; trees (mathematics); Bayesian spatial classifiers; MRF; Markov random fields; agricultural remote sensing; convergence; existence; fast recursive algorithms; geophysical measurement technique; image classification; image processing; image segmentation; leaves; marginal probability mass functions; nonlinear multivariable fixed-point equations; performance; spatial pattern classification; terrain mapping; tree approximations; tree termination; uniqueness; Bayesian methods; Classification tree analysis; Combinatorial mathematics; Cost function; Lattices; Markov random fields; Nonlinear equations; Remote sensing; Temperature distribution; Tree graphs;
Conference_Titel :
Image Processing, 1994. Proceedings. ICIP-94., IEEE International Conference
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-6952-7
DOI :
10.1109/ICIP.1994.413560