A proposed data converter for current signal with temperature-compensated sample resistor

In this paper, a data converter for current signal with temperature-compensated sampled resistor implemented in a mixed-signal CMOS process is presented. This circuit is suitable for the current signal processing very much since the low temperature coefficient resistor is integrated in a single chip. It operates with the single power supply of +5V. Experimental results show that the sample resistor is temperature-compensated with the variation of less than ±1% all over wide temperature range with the trimming technique. The current signal is processed with sample resistor and analog to digital converter with the accuracy of ± 3°C for the temperature sensor whose resolution is 1μA/°. The silicon area of the circuit is 4.2mm*5.2 mm including all the pads and ESD devices.