• DocumentCode
    2069024
  • Title

    The effects of electrical fast transient (EFT)/Burst on ADSL background noise

  • Author

    Abdullah, W. R Wan ; Mahtar, F. ; Abidin, A. N Zainal ; Jenu, M.Z.M. ; Ramli, A.

  • Author_Institution
    EMC&Power Quality Program, TM R&D Sdn. Bhd., Selangor
  • fYear
    2008
  • fDate
    19-23 May 2008
  • Firstpage
    84
  • Lastpage
    87
  • Abstract
    This paper investigates the effects of EFT/burst on ADSL noise spectral background. The conducted immunity EFT/burst test is a very severe test in EMC test family. The test signal is a very fast transient and has significant energy level. It is worth noting that because of their repetitive nature, EFT/burst events can also result in erratic behavior of a communication system. This paper is written with the aim of verifying experimentally the effects of EFT/burst signal on the ADSL 25 kHz to 2.2 MHz. Based on our early finding; it was found that the EFT/burst can increase the background noise power spectrum density within ADSL spectrum by 19 dB in average. This phenomenon definitely will reduce the signal to noise ratio (SNR) of the ADSL system, which will significantly jeopardize the ADSL performance and causing unreliable connectivity.
  • Keywords
    digital subscriber lines; electromagnetic compatibility; ADSL noise spectral background; EFT-burst events; EMC test family; communication system; electrical fast transient; power spectrum density; signal to noise ratio; Background noise; Communication cables; Digital communication; Electromagnetic compatibility; Electromagnetic transients; Gaussian noise; Immunity testing; Interference; Noise level; Signal to noise ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-981-08-0629-3
  • Electronic_ISBN
    978-981-08-0629-3
  • Type

    conf

  • DOI
    10.1109/APEMC.2008.4559817
  • Filename
    4559817