• DocumentCode
    2069029
  • Title

    Electroplating copper filling for 3D packaging

  • Author

    Nagai, Mizuki ; Tamari, Yusuke ; Saito, Nobutoshi ; Kuriyama, Fumio ; Fukunaga, Akira ; Owatari, Akira ; Shimoyama, M. ; Moore, Catherine

  • Author_Institution
    Ebara Corp., Fujisawa
  • fYear
    2009
  • fDate
    26-29 May 2009
  • Firstpage
    648
  • Lastpage
    653
  • Abstract
    Electroplating technology for via filling with copper for three-dimensional packaging is one of the strong candidates. The Cu electroplating technology for perfect via filling is discussed in this paper. A plating solution was prepared, in which plating deposition potential was found to be influential on its solution flow rate. The characteristics of organic additives in the plating solution were electrochemically measured with a rotary electrode so as to evaluate the influence of the solution flow and agitation on the organic additive functions. Optimization of organic additive concentrations and ratios in the plating solution was tried in order to establish the bottom-up growth in electroplating for perfect via filling. The selected plating solutions were applied to a dip-type plating system and evaluated by using the paddle agitation of the plating system. The combination of the plating system and plating solution showed the perfect filling of the high-aspect ratio via on a 300mm wafer.
  • Keywords
    copper; electroplating; integrated circuit packaging; 3D packaging; Cu; dip-type plating system; electroplating copper filling; electroplating technology; organic additive; plating deposition; size 300 mm; Additives; Anodes; Copper; Electrodes; Filling; Packaging; Space technology; System testing; Temperature control; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-4475-5
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2009.5074082
  • Filename
    5074082