Title :
Numerical characterization and evaluation of ESD induced field and coupling on interconnection cable
Author :
Gao, X.K. ; Li, E.P.
Author_Institution :
Inst. of High Performance Comput., Singapore
Abstract :
The paper presents a numerical study of the electrostatic discharge and its induced field radiation onto the interconnection cable. The device under test with the cable is modeled by introducing a finite integration technique (FIT) method. The field coupling on signal traces of interconnection cable is simulated. Different configuration of the cable is therefore proposed. The coupled voltages are analyzed and compared. The simulation results are in agreement with practical experiment. The measure to improve the electrostatic discharge immunity of cable is therefore discussed.
Keywords :
cables (electric); electrostatic discharge; integration; interconnections; printed circuits; ESD induced field; electrostatic discharge; finite integration technique; induced field radiation; interconnection cable; numerical characterization; Electromagnetic interference; Electromagnetic measurements; Electromagnetic radiation; Electrostatic discharge; Electrostatic interference; Flexible printed circuits; Immune system; Integrated circuit interconnections; Power cables; Voltage; Electromagnetic Interference; Electrostatic Discharge; Radiation coupling; Transmission Line;
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
DOI :
10.1109/APEMC.2008.4559819