DocumentCode :
2069186
Title :
Stress relaxation behaviour of connectors- development of simulation techniques
Author :
Schedin, E. ; Thuvander, A. ; Henderson, P. ; Sandberg, P. ; Kamf, A.
Author_Institution :
Swedish Inst. for Metals Res., Stockholm, Sweden
fYear :
1996
fDate :
16-20 Sept. 1996
Firstpage :
142
Lastpage :
150
Abstract :
The stress relaxation behaviour of a connector has been simulated using the Finite Element Method. Material data from stress relaxation tests (four-point-bending) are utilized as input data to derive the relaxation behaviour of a connector subjected to a steady state temperature field. The model comprises forming of the connector to a specified geometry and loading to a specified contact force. Relaxation data from four-point-bending tests are fitted to a power law expression for creep by setting a linear stress distribution through the sheet thickness. Other, more complex stress distributions were also used, but the result did not deviate much from the simple case. The creep data are used as input data for connector relaxation simulations. If relaxation data for the as-received material are utilized the rate of relaxation of the connector is underestimated compared to experiments. It is suggested that it is necessary to perform relaxation tests on cold worked material in order to correctly describe the relaxation behaviour of the bent portions of the connector. The effect of this approach is demonstrated and found successful. However, it is necessary to develop more reliable experimental methods to produce relaxation data on cold worked material.
Keywords :
electric connectors; finite element analysis; stress analysis; stress relaxation; cold worked material; connector; creep; finite element method; four-point-bending; power law; simulation; stress distribution; stress relaxation; temperature field; Connectors; Contacts; Creep; Finite element methods; Geometry; Materials testing; Solid modeling; Steady-state; Stress; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 1996. Proceedings of the Forty-Second IEEE Holm Conference on ??. Joint with the 18th International Conference on Electrical Contacts
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-3578-3
Type :
conf
DOI :
10.1109/HOLM.1996.557191
Filename :
557191
Link To Document :
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