Integrated arrayed waveguide grating spectrometer for measuring Raman spectra

Author

Ismail, Nur ; Sun, Fei ; Wörhoff, Kerstin ; Driessen, Alfred ; De Ridder, René M. ; Pollnau, Markus

Author_Institution

Integrated Opt. Microsyst. Group, Univ. of Twente, Enschede, Netherlands

fYear

2011

fDate

22-26 May 2011

Firstpage

1

Lastpage

1

Abstract

We designed a 3rd-order AWG using low-birefringence silicon oxynitride (SiON) waveguides with a SiO₂ cladding. The waveguide was chosen to have a cross-section of 2 μm x 0.52 μm, a core refractive index for TE polarization of 1.509 at 830 nm, and a cladding refractive index of 1.455. This choice results in the waveguides having zero birefringence at λ_c and low birefringence, Δn_eff,TM-TE = ±1.5 x 10^-4, at the edges of the Raman band of interest.

Keywords

Raman spectra; arrayed waveguide gratings; birefringence; claddings; integrated optics; light polarisation; optical design techniques; optical variables measurement; refractive index; silicon compounds; spectrometers; Raman band; Raman spectra measurement; SiO₂; SiON; TE polarization; birefringence; cladding refractive index; core refractive index; integrated arrayed waveguide grating spectrometer; low-birefringence silicon oxynitride waveguides; wavelength 830 nm; Arrays; Measurement by laser beam;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC), 2011 Conference on and 12th European Quantum Electronics Conference

Conference_Location

Munich

ISSN

Pending

Print_ISBN

978-1-4577-0533-5

Electronic_ISBN

Pending

Type

conf

DOI

10.1109/CLEOE.2011.5943074

Filename

5943074