Title :
Integrated arrayed waveguide grating spectrometer for measuring Raman spectra
Author :
Ismail, Nur ; Sun, Fei ; Wörhoff, Kerstin ; Driessen, Alfred ; De Ridder, René M. ; Pollnau, Markus
Author_Institution :
Integrated Opt. Microsyst. Group, Univ. of Twente, Enschede, Netherlands
Abstract :
We designed a 3rd-order AWG using low-birefringence silicon oxynitride (SiON) waveguides with a SiO2 cladding. The waveguide was chosen to have a cross-section of 2 μm x 0.52 μm, a core refractive index for TE polarization of 1.509 at 830 nm, and a cladding refractive index of 1.455. This choice results in the waveguides having zero birefringence at λc and low birefringence, Δneff,TM-TE = ±1.5 x 10-4, at the edges of the Raman band of interest.
Keywords :
Raman spectra; arrayed waveguide gratings; birefringence; claddings; integrated optics; light polarisation; optical design techniques; optical variables measurement; refractive index; silicon compounds; spectrometers; Raman band; Raman spectra measurement; SiO2; SiON; TE polarization; birefringence; cladding refractive index; core refractive index; integrated arrayed waveguide grating spectrometer; low-birefringence silicon oxynitride waveguides; wavelength 830 nm; Arrays; Measurement by laser beam;
Conference_Titel :
Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC), 2011 Conference on and 12th European Quantum Electronics Conference
Conference_Location :
Munich
Print_ISBN :
978-1-4577-0533-5
Electronic_ISBN :
Pending
DOI :
10.1109/CLEOE.2011.5943074
