• DocumentCode
    2069261
  • Title

    Dynamic finite element analysis simulation of the terminal crimping process

  • Author

    Villeneuve, Gary ; Kulkarni, Dan ; Bastnagel, Phil ; Berry, Dale

  • Author_Institution
    Ford Motor Co., Dearborn, MI, USA
  • fYear
    1996
  • fDate
    16-20 Sept. 1996
  • Firstpage
    156
  • Lastpage
    172
  • Abstract
    The lead time in order to develop the ideal terminal crimp, for low energy applications, is quite extensive. The terminal grip must first be designed, prototype tooled and the crimp specification developed and tested prior to approval and release. The factors of grip design, terminal material and crimp tooling, that govern the formation of a "good" crimp are also not clearly understood. In this study finite element analysis was used to simulate the crimping process, in order to better understand the underlying factors that govern crimp formation. FEA models were created using the ABAQUS program. In order to simplify the study, this work was conducted using two (2) and three (3) dimensional models. The terminal grip cross section, the punch tooling and the wire strands were modeled. In the FEA simulation, the grip was forced into the punch while sitting on the anvil. This mimics the real life application. The initial results of the study have shown that the friction between the grip surface and the punch surface is crucial to the formation of a "good" crimp. The models also showed that the crimping process is a combination of both the plane stress and plane strain conditions.
  • Keywords
    crimping; electric connectors; finite element analysis; ABAQUS program; crimping; dynamic finite element analysis simulation; friction; punch tooling; terminal grip; three dimensional model; two dimensional model; wire strands; Analytical models; Automotive engineering; Compressive stress; Computer simulation; Crimping; Finite element methods; Friction; Testing; Vehicle dynamics; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1996. Proceedings of the Forty-Second IEEE Holm Conference on ??. Joint with the 18th International Conference on Electrical Contacts
  • Conference_Location
    Chicago, IL, USA
  • Print_ISBN
    0-7803-3578-3
  • Type

    conf

  • DOI
    10.1109/HOLM.1996.557193
  • Filename
    557193