DocumentCode :
2069276
Title :
New Approach for Determining the Complex Dielectric Constant of Vegetation Leaves
Author :
Trabelsi, S. ; Ghomi, M. ; Peuch, J.C ; Baudrand, H.
Author_Institution :
Laboratoire d´´Electronique- Groupe de recherche microondes, 2, Rue C. Camichel 31071 TOULOUSE FRANCE, Tel: 19-33 61588324, Telex 530 171 code 7.
Volume :
2
fYear :
1992
fDate :
5-9 Sept. 1992
Firstpage :
1234
Lastpage :
1239
Abstract :
A new approach for modeling the vegetation leaves in the X-band is presented. Here, as an example a corn leaf is considered, where it is assumed to be a superposition of a cylindrical dielectric post and a very thin dielectric sheet. We determine the complex dielectric constant by a simulation model from measured S-parameters.
Keywords :
Dielectric constant; Dielectric materials; Dielectric measurements; Flanges; Mechanical variables measurement; Rectangular waveguides; Scattering parameters; Solid modeling; Vegetation; Veins;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1992. 22nd European
Conference_Location :
Helsinki, Finland
Type :
conf
DOI :
10.1109/EUMA.1992.335873
Filename :
4135618
Link To Document :
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