DocumentCode
2069276
Title
New Approach for Determining the Complex Dielectric Constant of Vegetation Leaves
Author
Trabelsi, S. ; Ghomi, M. ; Peuch, J.C ; Baudrand, H.
Author_Institution
Laboratoire d´´Electronique- Groupe de recherche microondes, 2, Rue C. Camichel 31071 TOULOUSE FRANCE, Tel: 19-33 61588324, Telex 530 171 code 7.
Volume
2
fYear
1992
fDate
5-9 Sept. 1992
Firstpage
1234
Lastpage
1239
Abstract
A new approach for modeling the vegetation leaves in the X-band is presented. Here, as an example a corn leaf is considered, where it is assumed to be a superposition of a cylindrical dielectric post and a very thin dielectric sheet. We determine the complex dielectric constant by a simulation model from measured S-parameters.
Keywords
Dielectric constant; Dielectric materials; Dielectric measurements; Flanges; Mechanical variables measurement; Rectangular waveguides; Scattering parameters; Solid modeling; Vegetation; Veins;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1992. 22nd European
Conference_Location
Helsinki, Finland
Type
conf
DOI
10.1109/EUMA.1992.335873
Filename
4135618
Link To Document