DocumentCode :
2069310
Title :
Study of transient response characteristics of electrons in GaN by Monte Carlo method
Author :
Ghosal, Amrita ; Biswas, Arijit
Author_Institution :
Inst. of Radio Phys. & Electron., Univ. of Calcutta, Kolkata, India
fYear :
2012
fDate :
17-19 Dec. 2012
Firstpage :
1
Lastpage :
3
Abstract :
The authors have theoretically investigated transient response of electrons in bulk Wurtzite GaN at 300K using one particle monte-carlo method. The relevant lattice scattering mechanisms like deformation potential acoustic phonons, polar optical phonons, impurity and intervalley phonon scatterings are incorporated in the Boltzmann transport equation which is then solved to obtain the transient response characteristics. The transient response characteristics at 300K show that higher peak drift velocities are obtained at higher field values. The velocity - field characteristics for electrons at 300K exhibit a negative differential resistance (NDR) effect.
Keywords :
Boltzmann equation; III-VI semiconductors; Monte Carlo methods; electrons; gallium compounds; transient response; wide band gap semiconductors; Boltzmann transport equation; GaN; NDR effect; bulk Wurtzite gallium nitride; deformation potential acoustic phonons; impurity; intervalley phonon scatterings; lattice scattering mechanisms; negative differential resistance effect; particle Monte Carlo method; polar optical phonons; temperature 300 K; transient response characteristics; velocity-field characteristics; Monte-Carlo method; Negative differential resistance (NDR) effect; Transient response;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computers and Devices for Communication (CODEC), 2012 5th International Conference on
Conference_Location :
Kolkata
Print_ISBN :
978-1-4673-2619-3
Type :
conf
DOI :
10.1109/CODEC.2012.6509253
Filename :
6509253
Link To Document :
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