Title :
An integrative approach to reliability analysis of an IEC 61850 digital substation
Author :
Yan Zhang ; Sprintson, A. ; Singh, C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
This paper focuses on the reliability evaluation of modern substation automation systems. Such systems include both physical devices such as lines, breakers, and transformers, as well as cyber devices (switches, intelligent electronic devices, and cables) and belong to a broader class of cyber-physical systems. We assume that the substation utilizes IEC 61850 standard, which is a dominant standard for substation automation. Focusing on IEC 61850 standard, we present the failure modes and analyze their effects on the system. We utilize reliability block diagrams for analyzing the reliability of substation components (bay units) and then use the state space approach to study the effects at the substation level. The results of our analysis provide critical input to evaluating the reliability of the substation and the effects of substation failures to the rest of the power system.
Keywords :
IEC standards; failure analysis; reliability; substation automation; IEC 61850 digital substation; cyber devices; cyber-physical systems; failure modes; integrative approach; intelligent electronic devices; modern substation automation systems; physical devices; power system; reliability analysis; reliability block diagrams; state space approach; substation component reliability; substation level; transformers; Circuit breakers; Circuit faults; IEC standards; Power system reliability; Power transmission lines; Reliability; Substations; Cyber-physical system; IEC 61850; State Space; reliability; substation layout; topology;
Conference_Titel :
Power and Energy Society General Meeting, 2012 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4673-2727-5
Electronic_ISBN :
1944-9925
DOI :
10.1109/PESGM.2012.6345699