DocumentCode :
2069447
Title :
Reliability enhancement of embedded capacitors in printed circuit boards using B-stage epoxy/BaTiO3 composite embedded capacitor films (ECFs)
Author :
Lee, Sangyong ; Jang, Jong Min ; Lee, Woong Sun ; Paik, Kyung-Wook
Author_Institution :
Dept. of Mater. Sci. & Eng., KAIST, Daejeon
fYear :
2009
fDate :
26-29 May 2009
Firstpage :
771
Lastpage :
776
Abstract :
Epoxy/ceramic composites are one of promising materials as embedded capacitors for a SiP technology, because they have a good processability and a compatibility with printed circuit boards (PCBs), in addition to a high dielectric constant. In this study, we have fabricated embedded capacitors in PCBs using epoxy/BaTiO3 ECFs, and evaluated their reliability at high temperature aging after moisture absorption. Factors influencing the reliability of epoxy/BaTiO3 ECF capacitors were analyzed in terms of materials formulation, the ratio of epoxy and BaTiO3, dispersant contents, and curing agent. From these results, epoxy/BaTiO3 ECFs materials were optimized in terms of reliability and dielectric properties. And, using these optimized epoxy/BaTiO3 ECFs, embedded capacitors in prototype-scale, 405 times 508 mm, PCBs were fabricated by conventional multi-layer PCB build-up processes. The total thickness of PCB including embedded capacitors was below 250 mum. And their reliability at high temperature aging after moisture absorption was well qualified.
Keywords :
ageing; barium compounds; capacitors; composite materials; curing; moisture; permittivity; printed circuits; reliability; system-in-package; titanium compounds; BaTiO3; curing agent; dielectric constant; dispersant contents; embedded capacitor films; embedded capacitors; moisture absorption; printed circuit boards; reliability enhancement; system-in-package; Absorption; Aging; Capacitors; Ceramics; Composite materials; Dielectric materials; Materials reliability; Moisture; Printed circuits; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2009.5074099
Filename :
5074099
Link To Document :
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