• DocumentCode
    2069520
  • Title

    Predicting common mode radiation of power bus structure excited by IC’s switching current

  • Author

    Sudo, Toshio

  • Author_Institution
    Shibaura Inst. of Technol., Tokyo
  • fYear
    2008
  • fDate
    19-23 May 2008
  • Firstpage
    160
  • Lastpage
    163
  • Abstract
    Predicting methods of common mode radiated emission of power bus structure have been investigated. Transient current flows at the power supply terminal was assumed to an exciting source, and the power bus consisted of power and ground planes was assumed to work as antenna of common mode radiation. Two simulation approaches were studied: one is a time-domain response-based approach, and another one was a frequency response-based approach. The test board consisted of 4 conductive layers was fabricated to verify simulation results. Then, transient power supply current of the IC was monitored, and far-field radiated emission was measured in an anechoic room. The simulation results obtained by both approaches showed a good agreement with the measurement results.
  • Keywords
    integrated circuits; power supply circuits; printed circuits; time-frequency analysis; IC switching current; anechoic room; common mode radiated emission; common mode radiation; far-field radiated emission; frequency response-based approach; power bus structure; power supply terminal; time-domain response-based approach; transient current flows; transient power supply current; CMOS logic circuits; Circuit simulation; Current supplies; Electromagnetic compatibility; Electromagnetic radiation; Electromagnetic transients; Monitoring; Power measurement; Power supplies; Printed circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-981-08-0629-3
  • Electronic_ISBN
    978-981-08-0629-3
  • Type

    conf

  • DOI
    10.1109/APEMC.2008.4559836
  • Filename
    4559836