DocumentCode
2069553
Title
The effects on SI and EMI for differential coupled microstrip lines over LPC-EBG power/ground planes
Author
Shih, Cheng-Hung ; Shiue, Guang-Hwa ; Wu, Tzong-Lin ; Wu, Ruey-Beei
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
fYear
2008
fDate
19-23 May 2008
Firstpage
164
Lastpage
167
Abstract
A power/ground planes design for efficiently eliminating the ground bounce noise (GBN) in high-speed digital circuits is proposed by using low-period coplanar electromagnetic band-gap (LPC-EBG) structure. However, it is unavoidable the signals will cross the LPC-EBG power plane. In this paper, the effects of signal integrity (SI) and electromagnetic interference (EMI) for differential coupled microstrip lines over the LPC-EBG power/ground planes will be investigated. The resonant frequency of LPC-EBG power plane will be picked up and appear in the radiation. The bandgap frequencies of LPC-EBG power plane will loss in weakly coupling case of differential lines at the received end. Further, the more coupling factor of differential lines is the less noise of SI and EMI is. The simulated results based on full-wave simulator will provide a good reference for the design of differential coupled microstrip lines over LPC-EBG power/ground planes.
Keywords
digital circuits; electromagnetic interference; microstrip lines; photonic band gap; EMI; LPC-EBG; differential coupled microstrip lines; electromagnetic interference; ground bounce noise; high-speed digital circuits; low-period coplanar electromagnetic band-gap; power-ground planes; signal integrity; Electromagnetic interference; Microstrip; Gsimultaneous switching noise (SSN); electromagnetic bandgap (EBG); electromagnetic interference (EMI); ground bounce noise(GBN); signal integrity (SI); slot;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location
Singapore
Print_ISBN
978-981-08-0629-3
Electronic_ISBN
978-981-08-0629-3
Type
conf
DOI
10.1109/APEMC.2008.4559837
Filename
4559837
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