• DocumentCode
    2069553
  • Title

    The effects on SI and EMI for differential coupled microstrip lines over LPC-EBG power/ground planes

  • Author

    Shih, Cheng-Hung ; Shiue, Guang-Hwa ; Wu, Tzong-Lin ; Wu, Ruey-Beei

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
  • fYear
    2008
  • fDate
    19-23 May 2008
  • Firstpage
    164
  • Lastpage
    167
  • Abstract
    A power/ground planes design for efficiently eliminating the ground bounce noise (GBN) in high-speed digital circuits is proposed by using low-period coplanar electromagnetic band-gap (LPC-EBG) structure. However, it is unavoidable the signals will cross the LPC-EBG power plane. In this paper, the effects of signal integrity (SI) and electromagnetic interference (EMI) for differential coupled microstrip lines over the LPC-EBG power/ground planes will be investigated. The resonant frequency of LPC-EBG power plane will be picked up and appear in the radiation. The bandgap frequencies of LPC-EBG power plane will loss in weakly coupling case of differential lines at the received end. Further, the more coupling factor of differential lines is the less noise of SI and EMI is. The simulated results based on full-wave simulator will provide a good reference for the design of differential coupled microstrip lines over LPC-EBG power/ground planes.
  • Keywords
    digital circuits; electromagnetic interference; microstrip lines; photonic band gap; EMI; LPC-EBG; differential coupled microstrip lines; electromagnetic interference; ground bounce noise; high-speed digital circuits; low-period coplanar electromagnetic band-gap; power-ground planes; signal integrity; Electromagnetic interference; Microstrip; Gsimultaneous switching noise (SSN); electromagnetic bandgap (EBG); electromagnetic interference (EMI); ground bounce noise(GBN); signal integrity (SI); slot;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-981-08-0629-3
  • Electronic_ISBN
    978-981-08-0629-3
  • Type

    conf

  • DOI
    10.1109/APEMC.2008.4559837
  • Filename
    4559837