DocumentCode :
2069662
Title :
Ball bumping and coining operations for TAB and flip chip
Author :
Levine, Lee
Author_Institution :
Kulicke & Soffa Ind. Inc., Willow Grove, PA, USA
fYear :
1997
fDate :
18-21 May 1997
Firstpage :
265
Lastpage :
267
Abstract :
The process of using a ball bonder to form bumps on a chip, for subsequent TAB or Flip Chip attachment to a substrate, has now reached the production stage. A number of companies are using the process for full scale production. Other companies are using the process for rapid prototyping and limited quantity production. The advantages of the ball bumping process are that it requires no expensive masks or wet processing. It also uses existing equipment, experienced personnel, and it has the flexibility and ease of manufacturing associated with wire bonding. The yields and reliability of wire bonding are well established, and the ball bumping process is the same as the ball bonding portion of the wire bond process. Similar yields are expected. In many cases ball bumping provides the most cost effective method for depositing bumps on chips. Two process variations are prevalent. 1. Bumping and coining, is a process where a normal ball bond with a short ductile fracture tip protruding from the top of the ball is bonded to the device. Optionally, the bumps are then coined flat by a second stage operation. 2. The stud bumping process produces a short loop with the crescent bond placed on the shoulder of the ball
Keywords :
flip-chip devices; integrated circuit reliability; integrated circuit yield; microassembling; tape automated bonding; TAB; ball bumping; coining operations; crescent bond; ductile fracture tip; flip chip; full scale production; rapid prototyping; reliability; stud bumping process; yields; Flip chip; Gold alloys; Metal product industries; Metals industry; Milling machines; Production; Substrates; Temperature control; Wafer bonding; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1997. Proceedings., 47th
Conference_Location :
San Jose, CA
ISSN :
0569-5503
Print_ISBN :
0-7803-3857-X
Type :
conf
DOI :
10.1109/ECTC.1997.606179
Filename :
606179
Link To Document :
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