• DocumentCode
    2069662
  • Title

    Ball bumping and coining operations for TAB and flip chip

  • Author

    Levine, Lee

  • Author_Institution
    Kulicke & Soffa Ind. Inc., Willow Grove, PA, USA
  • fYear
    1997
  • fDate
    18-21 May 1997
  • Firstpage
    265
  • Lastpage
    267
  • Abstract
    The process of using a ball bonder to form bumps on a chip, for subsequent TAB or Flip Chip attachment to a substrate, has now reached the production stage. A number of companies are using the process for full scale production. Other companies are using the process for rapid prototyping and limited quantity production. The advantages of the ball bumping process are that it requires no expensive masks or wet processing. It also uses existing equipment, experienced personnel, and it has the flexibility and ease of manufacturing associated with wire bonding. The yields and reliability of wire bonding are well established, and the ball bumping process is the same as the ball bonding portion of the wire bond process. Similar yields are expected. In many cases ball bumping provides the most cost effective method for depositing bumps on chips. Two process variations are prevalent. 1. Bumping and coining, is a process where a normal ball bond with a short ductile fracture tip protruding from the top of the ball is bonded to the device. Optionally, the bumps are then coined flat by a second stage operation. 2. The stud bumping process produces a short loop with the crescent bond placed on the shoulder of the ball
  • Keywords
    flip-chip devices; integrated circuit reliability; integrated circuit yield; microassembling; tape automated bonding; TAB; ball bumping; coining operations; crescent bond; ductile fracture tip; flip chip; full scale production; rapid prototyping; reliability; stud bumping process; yields; Flip chip; Gold alloys; Metal product industries; Metals industry; Milling machines; Production; Substrates; Temperature control; Wafer bonding; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1997. Proceedings., 47th
  • Conference_Location
    San Jose, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-3857-X
  • Type

    conf

  • DOI
    10.1109/ECTC.1997.606179
  • Filename
    606179