DocumentCode
2069662
Title
Ball bumping and coining operations for TAB and flip chip
Author
Levine, Lee
Author_Institution
Kulicke & Soffa Ind. Inc., Willow Grove, PA, USA
fYear
1997
fDate
18-21 May 1997
Firstpage
265
Lastpage
267
Abstract
The process of using a ball bonder to form bumps on a chip, for subsequent TAB or Flip Chip attachment to a substrate, has now reached the production stage. A number of companies are using the process for full scale production. Other companies are using the process for rapid prototyping and limited quantity production. The advantages of the ball bumping process are that it requires no expensive masks or wet processing. It also uses existing equipment, experienced personnel, and it has the flexibility and ease of manufacturing associated with wire bonding. The yields and reliability of wire bonding are well established, and the ball bumping process is the same as the ball bonding portion of the wire bond process. Similar yields are expected. In many cases ball bumping provides the most cost effective method for depositing bumps on chips. Two process variations are prevalent. 1. Bumping and coining, is a process where a normal ball bond with a short ductile fracture tip protruding from the top of the ball is bonded to the device. Optionally, the bumps are then coined flat by a second stage operation. 2. The stud bumping process produces a short loop with the crescent bond placed on the shoulder of the ball
Keywords
flip-chip devices; integrated circuit reliability; integrated circuit yield; microassembling; tape automated bonding; TAB; ball bumping; coining operations; crescent bond; ductile fracture tip; flip chip; full scale production; rapid prototyping; reliability; stud bumping process; yields; Flip chip; Gold alloys; Metal product industries; Metals industry; Milling machines; Production; Substrates; Temperature control; Wafer bonding; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1997. Proceedings., 47th
Conference_Location
San Jose, CA
ISSN
0569-5503
Print_ISBN
0-7803-3857-X
Type
conf
DOI
10.1109/ECTC.1997.606179
Filename
606179
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